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1. ST-FFP Series Far Field Profilometer Instrument

 

ST-FFP far field measurement instrument is a stand-alone device for measuring light intensity vs output angle of light emitting components such as high optical power laser diode bars and other high intensity light sources.

 

Features

·  Standard input wavelength range 400-1700 nm

·  Input optical power up to 100W CW

·  Scanning angle range ±90°

·  Angular resolution 0.03°

·  High dynamic range of >60 dB

·  Noise free measurement of pulsed light

·  USB connection, easy to use software

·  Advanced plotting features: 1D, 2D, 3D and contour plots

·  Tabular data displaying FWHM and NA

·  Export measurement data into various formats

·  Fixtures for FC, SMA fibers and various LEDs and lasers available

·  Maintenance free

 

Applications

·  Light emission intensity vs output angle analysis (a.k.a. far field)

·  High optical input power capability

·  Numerical aperture characterization of optical components

·  Designed for high power laser diodes

·  Automated laser diode quality assurance

·  Suitable for LED, laser diode, laser bar and fiber

 

Specifications:

Model

ST-FFP-VIS-IR

ST-FFP-RGB

Customized

Wavelength range

500 – 1700 nm

Separate R,G,B channels

From 200 to 3000 nm

Field of view

+/- 89°

+/- 89°

+/- 89°

Light input aperture

30 mm or SMA/FC fiber mount

30 mm or SMA/FC fiber mount

1-50 mm, custom shape

Agnle resolution

0.03°

0.03°

0.03°

Angle resolution in 3D scans

0.05°

0.05°

0.05°

Azimuth resolution

0.01°

0.01°

0.01°

Optical input power

50 µW – 100W

50 µW – 100W

10 µW – 200W

Dynamic range

>60 dB

>60 dB

Up to 90 dB

Sampling time

1.3 – 1000 ms

1.3 – 1000 ms

1 µs – 1 h

Scanning speed

0.05 – 300 °/s

0.05 – 300 °/s

0.05 – 300 °/s

Photodiode sensitivity ranges

5 decades

5 decades

5 decades

PC conncetion

USB

USB

USB or custom

Programming interface

ASCII text commands through virtual COM port, optional C# library with examples

ASCII text commands through virtual COM port, optional C# library with examples

Standard or customized

Power

12 V DC 1.5 A

12 V DC 1.5 A

12 V DC 1.5 A

Dimension

305x331x335mm

305x331x335mm

305x331x335mm

Weight

10kg

10kg

10kg

Approvals

CE

CE

CE

Software operating system

Windows 2000 or later,

32 or 64 bit OS

Windows 2000 or later,

32 or 64 bit OS

Windows 2000 or later,

32 or 64 bit OS

Data display

Cartesian, polar, 3D, contour, table

Cartesian, polar, 3D, contour, table

Cartesian, polar, 3D, contour, table

Export formats

CSV, PDF, PNG, PS, XML

CSV, PDF, PNG, PS, XML

CSV, PDF, PNG, PS, XML

 

Capabilities

 

2. ST-LDC Series Automated Laser Diode/Bar Characterization & Testing Systems

 

ST-LDC systems are fully configurable, all-in-one laser diode and LED characterization devices for industries and R&D laboratories. They’re designed to measure and analyze all major characteristics of laser diodes and LEDs in a fast and reproducible way. They’re ideal tool for data sheet generation, quality control, failure analysis and research activities with semiconductor emitters.

ST-LDC systems are customizable tool to meet various needs required by different activities. They can measure devices from UV-LEDs to telecom laser diodes and high power laser bars, we can features a camera assisted pick’n'place robot capable of collecting diodes from customer supplied trays and finally marking and sorting them after the tests.

 

Architecture

                  

ST-LDC systems are having modular construction based on robust field bus technology. This construction makes high scalability and easy maintenance possible while keeping number of components minimum.

On ST-LDC system without pick’n'place robotics, devices under test (DUTs) are loaded into the system on multichannel load-trays that are equipped with an individual low resistance bypass switch over each DUT to allow series connected devices operating even in case of open circuit or empty slots. Load tray also features channel specific temperature and voltage monitors and optionally a channel specific temperature control.

ST-LDC capabilities

 

Value

Remarks

DUT type

Laser diode, Laser bar, LED, HB LED, UHB LED

Multiple DUT adapters are possible with single ST-LDC

DUT current driver

> 0-500 mA (CW and/or pulsed)

> 0-5 A (CW and/or pulsed)

> 0-20A (CW and/or pulsed)

> 0-60A (CW and/or pulsed)

> 0-120A (CW and/or pulsed)

> 0-200A (pulsed only)

> 0-400A (pulsed only)

Multiple drivers are possible within single ST-LDC

Load-tray support

Yes

 

Power measurement (LIV)

0-200 W optical, 300 – 3000 nm

Various accuracy and calibration options available

Spectrum measurement

200 – 2400 nm, resolution from 10 pm to 1 nm

Based on OSA or spectrometer

Far field measurement

See ST-FFP specifications

 

Visual ispection

Near field integrity test

Available as low and high power type

DUT operating condition control

> TEC/peltier based, up to 30W cooling capacity per DUT, fast temperature variation possible

> Water cooled, up to 400W cooling capacity per DUT

> Nitrogen atmosphere optional

> Humidity control optional

Microchannel DUT support only with water cooling

By-emitter measurements

Spectrum, LIV, Polarity

Only laser for diode bars

Throughput

Depends on the ordered options, contact us to receive throughput calculations

 

Dimensions

1200 x 900 x 1500 mm

 

Weight

200 kg

 

Power

220-240 V AC 5 A

 

Approvals

CE

 

 

ST- LDCrobo additional capabilities

 

Value

Remarks

DUT type

Laser diode, Laser bar, LED, HB LED, UHB LED

Multiple DUT adapters are possible with single ST-LDC

Functions

> Locate and measure chip position

> Pick chip

> Align and place on testing bench

> Optionally mark chip

> Place chip: Back to the original tray, Sort to different trays, Discard

 

Machine vision alignment

Included

 

Throughput (standard model)

Up to 3 DUT per minute

Time varies by the tests to be performed, contact us for calculation

Throughput (high volume model)

Up to 10 DUT per minute

Tailor made system for specific testing needs, contact us for calculation

Bare chip handling

Yes

DUT’s supplied in a Gel-pak™

Mounted chip handling

Yes

Customer specific DUT trays

Available accuracy grades

> Basic: +/- 20 µm

> High: +/- 10 µm

> Extreme: +/- 1.25 µm

 

Dimensions

1200 x 900 x 1500 mm

 

Weight

200 kg

 

Power

220-240 V AC 5 A

 

Approvals

CE

 

 

Software:

 

Value

Remarks

Operating software

Measuretool

 

Result viewer & analysis tool

Result browser

 

Common Measurement Database (CMDB)

Yes

 

Operating system

Windows 7 32 bit

Supplied within LDC computer (included)

Optical Data analysis

 

Ith, Slope Efficiency, Wall plug efficiency

 

Electrical

Rs, Vbias

 

Thermal

T0, T1

 

Spectrum

dλ/dT, SMSR, peak λ, FWHM

 

Far field

FWHM, Beam Steering

 

 

Capabilities:

 

3. ST-BLT & ST-BLTnano Series Laser Diode Burn-in & Life-time Testers

 

ST-BLT series burn-in testers are designed for laser diode manufacturing industry. Stand alone ST-BLT test stations are optimal for high power laser diode burn-in testing and quality assurance. Unique characterization features of ST-BLT testers make them also suitable for simultaneous laser diode characterization and data sheet generation. Each ST-BLT system is assembled to meet customer’s specifications on laser bar optical power, mechanical dimensions, measurement features and throughput.

 

A typical ST-BLT system consist simultaneous burn-in station for 10 to 50 high power laser diodes or bars each emitting up to 150 W of optical power. A system uses shared measurement instruments and laser diode temperature controller for all laser bars making it very cost effective solution when compared to competing systems.

 

                     

ST-BLT systems have modular construction based on robust field bus technology. This construction makes high scalability and easy maintenance possible while keeping number of components minimum. Multiple ST-BLT systems can be operated from a single control computer. Devices under test (DUTs) are loaded into the system on multichannel load-trays that are equipped with an individual low resistance bypass switch over each DUT to allow series connected devices operating even in case of open circuit or empty slots. Load tray also features channel specific temperature and voltage monitors and optionally a channel specific temperature control.

 

ST-BLT specifications, on-line measurement model

 

Value

Remarks

Product name

ST-BLT

 

Scalability

1-64 ST-BLT cabinets per one system

 

DUT types

Laser diode, Laser bar, HB LED

 

Load-tray support

Yes

 

On-line measurements

LIV, Spectrum, Temperature

 

Measurement cycle

User definable

 

Current drive

Up to 200 A CW or pulsed, up to 20 kW per cabinet

 

Temperature control

Water cooling with chiller

TEC/peltier with individual DUT temperature setting

 

Safety & DUT fault detection

E-stop, Over-temperature, Smoke detector, Short circuits, Open circuits, Optical property change

 

Dimensions (W x H x D)

700 x 1800 x 1200 mm

Typical

Power

3 phase AC 380 VAC

 

 

ST-BLTnano, blind, non-characterizing type

 

Value

Remarks

Product name

ST-BLTnano

 

Scalability

1-64 BLTnano cabinets per one system

 

DUT types

Laser diode, Laser bar, LED, HB LED

 

Load-tray support

Yes

 

On-line measurements

Voltage, Temperature

 

Measurement cycle

Continuous

 

Current drive

Up to 100 A CW or pulsed / up to 1 kW

 

Temperature control

Water cooling with chiller

 

Safety & DUT fault detection

E-stop,  Over-temperature, Smoke detector, Short circuits, Open circuits

 

Dimensions (W x H x D)

700 x 500 210 mm

Typical

Power

1 phase 230 VAC

 

 

4. ST-VIS Series Visual Inspection System

 

ST-VIS is dedicated tool for laser bar inspection in production environment. This system inspects around 50 laser bars in hour for any visible defects in (sub threshold) near field or at surface of exit facet. While doing this system provides also accurate measurement from laser bar overhang and smile.

 

ST-VIS classifies all images and measurement results to passed / failed by internal criteria / failed by external criteria. These rulings may be used to see which bars can be sold, when bars can be sold although they have some defects and when bars are too defective to be sold. ST-VIS also provides systematic way to find defects. For example result stored to database can be: Emitter 18 had too large defect, and its overhang was too big (22.1 µm).

 

Features:

·  ST-VIS replaces operator in labour intensive facet inspection and provides key advantages

·  Defects are found every day – every hour. System does not have bad days and it does not get tired.

·  Simultaneous near field inspection provides enhanced way to find faulty devices

·  All results are systematically logged and easily accessible afterwards.

 

Facet and Near-Field inspection

The facet inspection option can be used to detect particles, cracks and coating defects down to 1 µm in diameter. With this option a microscope is used to take an image from front facet which can be analyzed either by the user or by machine vision software.

 

We have developed measurement modes that work in conjugation with facet inspection using same camera and opto-mechanics.  These new measurement options are sub-threshold NF imaging and overhang measurement. Sub threshold imaging of NF helps system to find defects that are difficult to find using regular machine vision imaging methods. This option provides enhanced defect detection. With this mode facet inspection (NF and visual) and overhang measurement can be done in less than 75 s per bar (19 visual inspection images, 19 NF images and overhang measurement). This enables inspection of more than 300 laser bars per day.

 

Overhang measurement

Second new mode, overhang measurement, allows system to use focus data from laser diode facet and from submount to determine overhang of laser bar. Overhang of the bar is measured from both edges of bar and for single emitters measurement is done at the centre. This verification is important in order to qualify bar mounting process.

 

Smile measurement

High precision smile measurement entity. Contains high resolution low distortion microscope and enhanced vibration isolation. This can be used to measure laser bars smile with +/- 0.2 µm accuracy (95% of confidence). Although system is vibration isolated, due to extreme accuracy of measurement, system must be installed in space without excessive noise and vibrations to reach specified accuracy.

 

Configurations:

       

ST-VIS cameras                                ST-VIS result studio

 

Specifications:

Property

Value

Remarks

DUT’s per Load tray

8,16 or 24

 

Throughput

0.5-2 DUTs/min

For 19-47 emitter bars

Particle regognition

1 µm

 

Near-field continuity check

Yes

 

Smile measurement resolution

100 nm

 

Smile measurement repeatability

+/- 250 nm

Typical

Overhang resolution

100 nm

 

Overhang repeatability

+/-1µm

Typical

Near-field laser drive current

0.1-100 mA

Auto-adjusting

SQL database support

Yes

 

Offline results browser

Yes

 

Dimensions

1200 x 750 x 1500 mm

 

Weight

220 kg

 

Power

230 VAC, 5A, 1-phase

 

Agencies

CE

 

 

Capabilities:

   

Repeatability of 100 overfhang measurements   

 

  Laser wavelength meter        Optical fiber analyzer

Sintec Optronics Pte Ltd

10 Bukit Batok Crescent #07-02 The Spire Singapore 658079

Tel: +65 63167112 Fax: +65 63167113  

E-mail: sales@sintec.sg sales@SintecOptronics.com

URL: http://www.sintec.sghttp://www.SintecOptronics.com

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