1. ST-FFP Series Far Field Profilometer Instrument

ST-FFP far field measurement instrument is a stand-alone device for measuring light intensity vs output angle of light emitting components such as high optical power laser diode bars and other high intensity light sources.

Features

�  Standard input wavelength range 400-1700 nm

�  Input optical power up to 100W CW

�  Scanning angle range �90�

�  Angular resolution 0.03�

�  High dynamic range of >60 dB

�  Noise free measurement of pulsed light

�  USB connection, easy to use software

�  Advanced plotting features: 1D, 2D, 3D and contour plots

�  Tabular data displaying FWHM and NA

�  Export measurement data into various formats

�  Fixtures for FC, SMA fibers and various LEDs and lasers available

�  Maintenance free

Applications

�  Light emission intensity vs output angle analysis (a.k.a. far field)

�  High optical input power capability

�  Numerical aperture characterization of optical components

�  Designed for high power laser diodes

�  Automated laser diode quality assurance

�  Suitable for LED, laser diode, laser bar and fiber

Specifications:

Capabilities

2. ST-LDC Series Automated Laser Diode/Bar Characterization & Testing Systems

ST-LDC systems are fully configurable, all-in-one laser diode and LED characterization devices for industries and R&D laboratories. They�re designed to measure and analyze all major characteristics of laser diodes and LEDs in a fast and reproducible way. They�re ideal tool for data sheet generation, quality control, failure analysis and research activities with semiconductor emitters.

ST-LDC systems are customizable tool to meet various needs required by different activities. They can measure devices from UV-LEDs to telecom laser diodes and high power laser bars, we can features a camera assisted pick�n'place robot capable of collecting diodes from customer supplied trays and finally marking and sorting them after the tests.

Architecture

ST-LDC systems are having modular construction based on robust field bus technology. This construction makes high scalability and easy maintenance possible while keeping number of components minimum.

On ST-LDC system without pick�n'place robotics, devices under test (DUTs) are loaded into the system on multichannel load-trays that are equipped with an individual low resistance bypass switch over each DUT to allow series connected devices operating even in case of open circuit or empty slots. Load tray also features channel specific temperature and voltage monitors and optionally a channel specific temperature control.

ST-LDC capabilities

ST- LDCrobo additional capabilities

Software:

Capabilities:

3. ST-BLT & ST-BLTnano Series Laser Diode Burn-in & Life-time Testers

ST-BLT series burn-in testers are designed for laser diode manufacturing industry. Stand alone ST-BLT test stations are optimal for high power laser diode burn-in testing and quality assurance. Unique characterization features of ST-BLT testers make them also suitable for simultaneous laser diode characterization and data sheet generation. Each ST-BLT system is assembled to meet customer�s specifications on laser bar optical power, mechanical dimensions, measurement features and throughput.

A typical ST-BLT system consist simultaneous burn-in station for 10 to 50 high power laser diodes or bars each emitting up to 150 W of optical power. A system uses shared measurement instruments and laser diode temperature controller for all laser bars making it very cost effective solution when compared to competing systems.

ST-BLT systems have modular construction based on robust field bus technology. This construction makes high scalability and easy maintenance possible while keeping number of components minimum. Multiple ST-BLT systems can be operated from a single control computer. Devices under test (DUTs) are loaded into the system on multichannel load-trays that are equipped with an individual low resistance bypass switch over each DUT to allow series connected devices operating even in case of open circuit or empty slots. Load tray also features channel specific temperature and voltage monitors and optionally a channel specific temperature control.

ST-BLT specifications, on-line measurement model

ST-BLTnano, blind, non-characterizing type

4. ST-VIS Series Visual Inspection System

ST-VIS is dedicated tool for laser bar inspection in production environment. This system inspects around 50 laser bars in hour for any visible defects in (sub threshold) near field or at surface of exit facet. While doing this system provides also accurate measurement from laser bar overhang and smile.

ST-VIS classifies all images and measurement results to passed / failed by internal criteria / failed by external criteria. These rulings may be used to see which bars can be sold, when bars can be sold although they have some defects and when bars are too defective to be sold. ST-VIS also provides systematic way to find defects. For example result stored to database can be: Emitter 18 had too large defect, and its overhang was too big (22.1 �m).

Features:

�  ST-VIS replaces operator in labour intensive facet inspection and provides key advantages

�  Defects are found every day � every hour. System does not have bad days and it does not get tired.

�  Simultaneous near field inspection provides enhanced way to find faulty devices

�  All results are systematically logged and easily accessible afterwards.

Facet and Near-Field inspection

The facet inspection option can be used to detect particles, cracks and coating defects down to 1 �m in diameter. With this option a microscope is used to take an image from front facet which can be analyzed either by the user or by machine vision software.

We have developed measurement modes that work in conjugation with facet inspection using same camera and opto-mechanics.  These new measurement options are sub-threshold NF imaging and overhang measurement. Sub threshold imaging of NF helps system to find defects that are difficult to find using regular machine vision imaging methods. This option provides enhanced defect detection. With this mode facet inspection (NF and visual) and overhang measurement can be done in less than 75 s per bar (19 visual inspection images, 19 NF images and overhang measurement). This enables inspection of more than 300 laser bars per day.

Overhang measurement

Second new mode, overhang measurement, allows system to use focus data from laser diode facet and from submount to determine overhang of laser bar. Overhang of the bar is measured from both edges of bar and for single emitters measurement is done at the centre. This verification is important in order to qualify bar mounting process.

Smile measurement

High precision smile measurement entity. Contains high resolution low distortion microscope and enhanced vibration isolation. This can be used to measure laser bars smile with +/- 0.2 �m accuracy (95% of confidence). Although system is vibration isolated, due to extreme accuracy of measurement, system must be installed in space without excessive noise and vibrations to reach specified accuracy.

Configurations:

ST-VIS cameras                                ST-VIS result studio

Specifications:

Capabilities:

Repeatability of 100 overfhang measurements   

 Optical fiber analyzer